The current status of trademark application 556217 for LEICA is RegisteredView Additional Representation Sheet.
The trademark information displayed on this page is public information and is provided for informational purposes only. This information may be incomplete, inaccurate, or outdated, and IndiaFilings does not guarantee its accuracy. IndiaFilings is an independent platform and is not associated, affiliated, or connected with any trademark listed in this database. We do not represent or speak on behalf of any such trademark. If you are trying to contact a specific trademark, please use their official channels. IndiaFilings cannot assist with queries directed at other companies.
| Application Number | 556217 |
| Trademark Status | RegisteredView Additional Representation Sheet |
| Trademark Class | 9 |
| Application Date | 1991-08-09 |
| Proprietor Name | (1) LEICA TECHNOLOGY BV.Trading As : LEICA TECHNOLOGY BV.Body Incorporate |
| Appropriate Office | DELHI |
| State | STATE NOT SPECIFIED |
| Trademark Type | DEVICE |
| User Details | Proposed to be used |
| Agent Name | CHANDRAKANT M. JOSHI[380] |
| Agent Address | 501, VISHWA NANAK, ANDHERI CHAKALA ROAD, ANDHERI (E), MUMBAI - 400 099. |
| Goods And Services Details | [CLASS : 9] SCIENTIFIC, PRECISION MECHANICAL, OPTICAL, ELECTRONIC APPARATUS AND INSTRUMENTS MICROSCOPES, ESPECIALLY OPTICAL MICROSCOPES, STEREO MICROSCOPES, LASER SCANNING MICROSCOPES, MEASURING MICROSCOPES, PHOTO MICRO SCOPES, SCANNING ELECTRON MICROSCOPES, ACOUSTIC MICRISCIPES SCANNING TUNNELING MICROSCOPES, SCANNING NEAR FIELD MICROSCOPES MACROSCOPES, PHOTOMACROSCOPES, MICROTOMS, ESPECIALLY ULTRAMICROTOMES, CRYOMICROTOMES, ELECTRON BEAM LITHOGRAPHIC APPARATUS AND INSTRUMENTS, ELECTRON BEAMING TESTING AND ANALYZING APPARATUS AND INSTRUMENTS; PLOTTERS, ESPECIALLY FLAT BED PLOTTERS, CUTTING TOOLS PLOTTERS, ;ASER SCANNING PLOTTERS; IMAGE ANALYZING APPARATUS AND INSTRUMENTS, ELECTRONIC IMAGE RECORDING PROCESSING, MODIFYING AND DISPLAY APPARATUS AND INSTRUMENT FOR PRODUCING, MEASURING AND/ OR ANALYZING PHOTOGRAPHS, CARTOGRAPHICAL AND TOPOGRAPHICAL APPARATUS AND INSTRUMENTS; STEREO-ANALYZING AND STEREO-INTERPRETING, INSTRUMENTS; ESPECIALLY THEODOLITES, LEVELS, TACHYMETERS, INCLINATION MEASURING INSTRUMENTS, COMPASS; SURVEYINGS, APPARATUS AND INSTRUMENTS; GLOBAL POSITIONING APPARATUS AND INSTRUMENTS; DISTANCE MEASURING INSTRUMETNS, DISTANCE SENSORS/DETECTORS; DIMENSONAL MEASURING APARATUS AND INSTRUMENTS, OPTOELECTRONIC SENSORE AND DETECTORS THERMAL IMAGING APPARATUS AND INSTRUMENTS, NIGHT VISION APPARATUS AND INSTRUMENTS; AND PARTS AND FITTINGS FOR AL THE AFORMENTIONED GOODS; SYSTEMS ARRANGED BY THE AFORMENTIONED APPARATUS AND INSTRUMENTS; COMPUTER PROGRAMS STORED ON THE DATA MATERIAL (SOFTWARE).Associated Trademarks 176196, 482870, 556215 |
Similar trademarks found for this brand
| Brand | Class | Status |
|---|---|---|
| LEICA | 9 | RegisteredView Additional Representation Sheet |
| LEICA | 9 | RegisteredView Additional Representation Sheet |
| LEICA | 9 | RegisteredView Additional Representation Sheet |
| LEICA | 10 | RegisteredView Additional Representation Sheet |
| LEICA | 9 | RegisteredView Additional Representation Sheet |
| LEICA | 10 | RegisteredView Additional Representation Sheet |
Common questions about LEICA.