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| Application Number | 1630946 |
| Trademark Status | Registered |
| Trademark Class | 9 |
| Trademark Description | COMPUTER HARDWARE AND SOFTWARE FOR DESIGNING AND MANUFACTURING SEMICONDUCTOR WAFERS, MASKS AND RETICLES, METROLOGY AND INSPECTIONS TOOLS FOR MEASURING, DETECTING, INSPECTING AND SENSING CHEMICAL COMPOSITIONS, TEMPERATURE, LIGHT IMAGES, THICKNESS, FLATNESS, TEXTURE, LINE WIDTH AND CONTAMINATION OF SEMICONDUCTOR WAFERS, MASKS AND RETICLES DURING THE MANUFACTURING PROCESS. |
| Application Date | 2007-12-14 |
| Journal No. | 1609-0 |
| Journal Date | 2013-10-07 |
| Proprietor Name | ASML NETHERLANDS B.V. |
| User Details | 2027-12-14 |
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